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IEEE科技文獻引領全球半導體行業發展  
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IEEE科技文獻引領全球半導體行業發展
 
IEEE科技文獻代表全球最新最前沿研發動態,其跨學科、多學科的研究成果與解決方案將進一步激發科研機構產生新的創意與想法,從而轉化為創新專利與新型產品。
 
2013年,1790 Analytics LLC針對專利申請量最多的25家全球著名高科技企業的研究表明,IEEE科技文獻被其專利申請文檔的引用量排名第一
•        領先于其他同類科技出版社3倍之多
•        1997年以來專利對IEEE文獻的引用量增長了660%
•        科技文獻對專利的重要性日趨增大
•        IEEE科技文獻對科技創新者的價值越來越大
 
IEEE科技文獻主要涉及多個核心領域,在半導體行業,IEEE始終引領著整個行業的發展:
 
半導體行業專利對IEEE科技文獻的引用情況:



半導體行業著名高科技企業對IEEE文獻的引用情況:



IEEE關于半導體行業的文獻資料:



IEEE關于半導體行業的期刊列舉:
 
•       IEEE Transactions on Electron Devices
•       IEEE Photonics Technology Letters
•       IEEE Journal of Quantum Electronics
•       IEEE Transactions on Semiconductor Manufacturing
•       IEEE Solid-State Circuits Magazine
•       IEEE Journal of Solid-State Circuits
 
IEEE關于半導體行業的會議列舉:
 
•       IEEE International Conference on Semiconductor Electronics
•       IEEE International Semiconductor Laser Conference
•       IEEE Semiconductor Thermal Measurement and Management Symposium
•       IEEE Symposium on Compound Semiconductor Integrated Circuit
•       IEEE Symposium on Semiconductor Thermal Measurement and Management
•       IEEE/SEMI Conference and Workshop Advanced Semiconductor Manufacturing
•       International Conference on Advanced Semiconductor Devices and Microsystems
•       International Conference on Advanced Thermal Processing of Semiconductors
•       International Conference on Semiconductor Laser and Photonics
•       International Semiconductor Conference
•       International Semiconductor Device Research Symposium
•       International Symposium on Power Semiconductor Devices and ICs
•       International Symposium on Semiconductor Device Research
•       International Symposium on Semiconductor Manufacturing
 
IEEE關于半導體行業的標準列舉:
 
IEEE 592-2007   Standard for Exposed Semiconducting Shields on High-Voltage
Cable Joints and Separable Connectors
IEEE 1450.1-2005   Standard for Extensions to Standard Test Interface Language
(STIL) (IEEE Std 1450 /SUP TM/ 1999) for Semiconductor Design Environments
IEC 62526 edition 1.0 2007 Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEEE C57.18.10-1998   Standard Practices and Requirements for Semiconductor Power
Rectifier Transformers
IEEE C62.35-2010   Standard Test Methods for Avalanche Junction Semiconductor
Surge-Protective Device Components
N42.31-2003   American National Standard for Measurement Procedures for
Resolution and Efficiency of Wide-Band Gap Semiconductor Detectors of Ionizing Radiation
 
客戶列舉:
IEEE已與半導體行業多家頂尖機構開展深度合作,代表機構有:



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